Scientific, measuring and detecting apparatus and instruments, including diffractometers, X-ray diffractometers and wafer analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers; X-ray detectors; analytical apparatus for analysing samples in scientific, industrial and laboratory applications, including X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and wafer analysers; materials characterization apparatus, including scientific and measuring apparatus and instruments, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus; analytical, process control and measuring apparatus, including diffractometers, X-ray diffractometers and X-ray diffraction meters; metrology tools, including diffractometers, X-ray diffractometers and X-ray diffraction meters; diffraction apparatus [microscopy]; diffraction apparatus and instruments; X-ray diffraction instruments; computer software for use in relation to diffractometry; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to X-ray apparatus; parts and fittings for all the aforesaid goods.;
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